Spatial Detection of Line Scratch Based on Histogram

xi hu,xiaokang yang,li chen
DOI: https://doi.org/10.1007/978-3-642-34595-1_28
2012-01-01
Abstract:This paper presents a histogram degradation model of line scratch. The degradation of line scratch results in compression of its column's histogram, which can be expressed by histogram's key features. Based on the histogram model, a histogram-based approach of line scratch detection is proposed. By combining the scratch histogram model and a serious of constraints such as Weber's Law, width selection and symmetry selection, the proposed algorithm performs well automatically. The experimental results show that the proposed algorithm work better in terms of false alarms rejection with low computing complexity.
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