Metamaterial characterization using structured light

Jinwei Zeng,Jingbo Sun,Xi Wang,Alexander N. Cartwright,Natalia M. Litchinitser
DOI: https://doi.org/10.1364/fio.2013.ftu1f.2
2013-01-01
Abstract:We propose and demonstrate a technique for characterization of optical metamaterials, metasurfaces, and ultra-thin films based on the interferometry employing optical vortices. This tool may find applications in the general area of optical nanostructure characterization.
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