Optimizing multilayer design for high density optical disks with very thin films

yang wang,donghong gu,fuxi gan

DOI: https://doi.org/10.1117/12.483278

2002-01-01

Abstract:The optical constants of each layer in the optical disk are assumed to be constant regardless of film thickness in conventional optical design and optimization of the multilayer structures. However, this assumption is not valid when the layer becomes very thin for its discontinuity. As we know, very thin layers (<50 nm) are included in the high-density and super-high density optical disks, such as DVD-RAM, high-density DVD (HD-DVD), and super-resolution near-field structure (Super-RENS). In this paper, the thickness error sensitivity factor for dielectric optical multilayer was derived from the optical matrix, and the change of optical constant of the very thin layers with the film thickness variation is analyzed at the same time. The effect of the thickness error and corresponding refractive index change on the reflectivity or reflectivity contrast of the optical disk multilayer was analyzed with a numerical calculation. As an example, we made a structure optimization for the 4-layer DVD-RAM systems with GeSbTe and AgInSbTe phase-change materials as recording media. These results are significant in improving the accuracy of optical design and thermal simulation of high density and super-high density optical disks.