C2WH-YMK Model and Its Application in Evaluating Manufacturing Development

Yong-rui DUAN,Peng TIAN,Wei-ping ZHANG
DOI: https://doi.org/10.3321/j.issn:1006-2467.2005.03.022
2005-01-01
Abstract:Data envelopment analysis (DEA) is a non-parameter statistical method appropriate for investigating the efficiency of converting multiple inputs into multiple outputs. In view of the fact that existing YMK-DEA model can not take the decision-maker's preference into consideration,a C~2WH -YMK model that can take decision-makers' preference into consideration was introduced. An example of this model in manufacturing development shows its usefulness.
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