The Electrochromism of Sputtered Nickel Oxide Films

XP Zhang,JY Tang,YM Sun
DOI: https://doi.org/10.1117/12.483328
2002-01-01
Abstract:The X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) were used to analysis the chemical composition and valence of sputtered electrochromic nickel oxide films in as-deposited, fully bleached and colored states. Experimental results showed that no Ni(OH)(2) exists in these three states. Potassium adsorbs at the NiO film surface instead of entering the lattice of nickel vacancies when the nickel oxide films were coloring/bleaching cycled in KOH solution. And the chemical valence of Ni does not seem to change after coloring and bleaching. A new electrochromism for sputtered nickel oxide films in aqueous electrolytes is proposed.
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