Real-Time Visualization Of Morphological Evolution Of N,N '-Di(Naphthalene-1-Yl)-N,N '-Diphthalbenzidine Thin Films: Variable Temperature Atomic Force Microscopy Study

Ms Xu,Jb Xu,J An
DOI: https://doi.org/10.1142/9789812796714_0061
2003-01-01
International Journal of Nanoscience
Abstract:Variable temperature tapping mode atomic force microscopy is exploited to in situ visualize the morphological evolution of N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine (NPB) thin film. The apparent glass transition of the NPB thin film initially occurred at 60 degrees C, proceeded until 95 degrees C, and crystallization from the glassy state quickly appeared at 135 degrees C. The NPB thin film gradually melted and disappeared when the temperature was above 175 degrees C, revealing the underlying layer. These observations are technically helpful and significant to gauge the temperature dependent lifetime and luminance of organic light-emitting diodes.
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