Research of Temporal Speckle Pattern Interferometry for In-Plane Measurement

Guangyu Li,Zhan Gao,Yan Deng
DOI: https://doi.org/10.1117/12.2034061
2013-01-01
Abstract:In this paper, a ridge algorithm which is based on wavelet analysis is adopted in the measurement of in-plane displacement. To measure in-plane displacement by electronic speckle pattern interferometry (ESPI), a series of speckle patterns are captured with the help of a CCD camera which is known as temporal speckle pattern interferometry (TSPI) technique and TSPI technique has better correlation and a larger measuring range compared with ESPI technique. To retrieve the phase fluctuation caused by the displacement of specimen, three types of complex wavelets are selected in the wavelet analysis to compare with the traditional Fourier analysis.
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