Abstract:The surface potential distribution measured using Kelvin probe force microscopy (KPFM) is influenced by the contact potential difference (CPD) between the tip and surface, the stray capacitance of the cantilever, and fixed monopole charges on the surface and tip. The interpretation of atomic-scale KPFM contrast studies has been controversial. Here, we investigate the contrast mechanism in KPFM with atomic resolution. First, the effect of stray capacitance on potential measurements is explored in the FM-, AM-, and heterodyne AM-KPFM modes. The distance dependence of the modulated electrostatic force in AM-KPFM is much weaker than that in FM-and heterodyne AM-KPFM, and the stray capacitance of the cantilever, which strongly affects potential measurements in AM-KPFM, is almost completely eliminated in FM-and heterodyne AM-KPFM. The very small local contact potential difference (LCPD) corrugation in AM-KPFM is attributed to an artefact induced by the topographic feedback. Next, an investigation of the LCPD on a TiO2 (110)-1 x 1 surface and atom-dependent bias-distance spectroscopic mapping are performed. The LCPD of TiO2 (110) is dominated not only by the permanent surface dipole between the tip apex atom and the surface, but also by the dipoles induced by the chemical interaction between the tip and sample. Finally, we propose a new multiple-image method for obtaining the frequency shift, tunneling current, and LCPD images. For the first time, we obtain three images on a TiO2(110) surface with atomic resolution at 78 K. The LCPD has a higher value on a defect site than on the nearby O rows because excess electrons caused by surface defects are delocalized on the nearby Ti rows. The multiple-image method can be used to investigate the charge transfer phenomena between nanoparticles and surface sites and to elucidate the mechanisms of catalytic reactions.

Chemical Identification at Atomic Resolution on Cu(110)-O Surface Using NC-AFM

Atomic Species Recognition on Oxide Surfaces Using Low Temperature Scanning Probe Microscopy

Theoretical Study on the Atomic Structure, Electronic States, and STM Image of C(2×2) Cu(001)/O Surface

Scanning Tunneling Microscopy Study of Surface Reconstruction Induced by N Adsorption on Cu（100） Surface

Benchmarking atomically defined AFM tips for chemical-selective imaging

Chemical identification of point defects and adsorbates on a metal oxide surface by atomic force microscopy

Multi-Channel Exploration of O Adatom on TiO2(110) Surface by Scanning Probe Microscopy

Measurement of Sub-Surface Microstructures Based on a Developed Ultrasonic Atomic Force Microscopy

Standardization of chemically selective atomic force microscopy for metal-oxide surfaces

Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.

Modifying the STM Tip for the ' Ultimate ' Imaging of the Si(111)-7×7 Surface and Metal-supported Molecules

Stable contrast mode on TiO2(110) surface with metal-coated tips using AFM.

Sexiphenyl on Cu(100): nc-AFM tip functionalization and identification

Determining structural and chemical heterogeneities of surface species at the single-bond limit

AFM and XPS Study on the Surface and Interface States of CuPc and SiO2 Films

Investigation of Tunneling Current and Local Contact Potential Difference on the TiO2(110) Surface by AFM/KPFM at 78 K

Exploring Molecules Beyond CO As Tip Functionalizations in High-Resolution Noncontact Atomic Force Microscopy: A First Principles Approach

Surface Reconstruction in the CuO(001) Surface: from Square-Planar to Tetrahedral Coordination for CuO4 Unit

Direct Imaging of Molecular Orbitals of Metal Phthalocyanines on Metal Surfaces with an O2-Functionalized Tip of a Scanning Tunneling Microscope

Kelvin Probe Force Microscopy with Atomic Resolution

Local Crystallography Analysis for Atomically Resolved Scanning Tunneling Microscopy Images