A Planar Metrology Method Based on Image Sequence

Hui Zeng,Baoqing Zhang,Zhichun Mu,Xiuqing Wang
DOI: https://doi.org/10.2991/3ca-13.2013.74
2013-01-01
Abstract:This paper presents a novel planar metrology method based on image sequence. Compared with the planar metrology method based on single image, the proposed method can enlarge the measuring range effectively. The main reference planar template and the auxiliary reference planar template are used to achieve the transformation between the three-dimensional coordinate systems of different images. The auxiliary reference planar template of the former image is the main reference planar template of the latter image, and their positions remain invariant in the process of the metrology. The main reference planar template are used to obtain the 3D measuring information and the auxiliary reference planar template are used to transform the coordinates of feature points to the same three-dimensional coordinate system. Extensive experimental results show that the proposed method can meet the need of the metrology of the large scene.
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