Analysis On The Causes Of Decline Of Mlcc Insulation Resistance

Wei Jiang,Yongda Hu,Shengxiang Bao,Song Lijie,Zheng Yuwei,Yongqiang Cui,Li Qiang

DOI: https://doi.org/10.1109/icept.2015.7236807

2015-01-01

Abstract:In this paper, based on the results of SEM and EDS analysis, I would like to share the discovery of MLCC failure due to insulation resistance. For external factors, The defects which caused by mechanical stress can lead to lack of insulation resistance. For the intrinsic factors, MLCC insulation resistance failure is due to the presence of defects, and the main defects include void in ceramic dielectric and delamination of porcelain body and inner electrode. These defects are difficult to analyze. With the help of SEM electron microscope detection, these defets can be see. The reason is the poor control of sintering process. In the test, these defects will cause the capacitor quickly form a conductive channel, finally lead to insulation resistance failure.