Intrinsic Characteristics of Semiconducting Oxide Nanobelt Field-Effect Transistors

Yi Cheng,P. Xiong,Lenwood Fields,J. P. Zheng,R. S. Yang,Z. L. Wang
DOI: https://doi.org/10.1063/1.2338754
IF: 4
2006-01-01
Applied Physics Letters
Abstract:Field-effect transistors (FETs) based on individual semiconducting oxide (SnO2 and ZnO) nanobelts with multiterminal electrical contacts have been fabricated and characterized. Simultaneous two-terminal and four-terminal measurements enable direct correlation of the FET characteristics with the nature of the contacts. Devices with high-resistance non-Ohmic contacts exhibit a Schottky barrier FET behavior. In contrast, low-resistance Ohmic contacts on the nanobelt lead to high-performance n-channel depletion mode FETs with well-defined linear and saturation regimes, large “on” current, and an on/off ratio as high as 107. The FET characteristics of such devices show a significant modification by a 0.2% H2 gas flow at room temperature. The excellent intrinsic characteristics of these nanobelt FETs make them ideal candidates as nanoscale biological and chemical sensors based on field-effect modulation of the channel conductance.
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