Enhanced Magneto-Optic Kerr Effects In Thin Magnetic Metallic Layered Structures

william a mcgahan,liangyao chen,z s shan,d j sellmyer,john a woollam
DOI: https://doi.org/10.1063/1.102004
IF: 4
1989-01-01
Applied Physics Letters
Abstract:Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.
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