Determining Thermal Diffuse Scattering of Vanadium with X-Ray Transmission Scattering

Y Ding,P Chow,HK Mao,Y Ren,CT Prewitt
DOI: https://doi.org/10.1063/1.2170142
IF: 4
2006-01-01
Applied Physics Letters
Abstract:In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods.
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