Dielectric Properties of Organic Monolayers Directly Bonded on Silicon Probed by Current Sensing Atomic Force Microscope

JW Zhao,K Uosaki
DOI: https://doi.org/10.1063/1.1609237
IF: 4
2003-01-01
Applied Physics Letters
Abstract:The dielectric properties of alkyl monolayers with various chain lengths [CH3(CH2)n−1- (n=12, 14, 16, and 18)] covalently bonded to a hydrogen terminated n-type silicon (111) surface in a nanoscale region were evaluated using current sensing atomic force microscopy (AFM). A reliable electrical contact between the alkyl monolayers and the metal-coated AFM tip was achieved under slight stress. At a force less than 2 nN, current sharply increased as the bias was scanned over a critical value, showing that breakdown took place. The breakdown voltage linearly depended on the chain length of the alkyl monolayers and the dielectric strength of 2.0 GV/m was derived from the slope of this relation.
What problem does this paper attempt to address?