High-performance InP-based bias-tunable near-infrared /extended-short wave infrared dual-band photodetectors
Zongti Wang,Jian Huang,Liqi Zhu,Zhiqi Zhou,Xuyi Zhao,Antian Du,Wenfu Yu,Ruotao Liu,Qian Gong,Baile Chen
DOI: https://doi.org/10.1109/jlt.2022.3171224
IF: 4.7
2022-01-01
Journal of Lightwave Technology
Abstract:In this paper, a vertical stacked near-infrared (NIR) and extended short wavelength infrared (eSWIR) dual-band detector based on InGaAs and In0.53Ga0.47As/GaAs0.5Sb0.5 type-II superlattice (T2SL) is presented. A barrier layer of AlAs0.56Sb0.44 allows the independent working of the two sub-detectors. The InGaAs NIR sub-detector operates under positive bias, while the eSWIR band detector operates under reverse bias. The NIR sub-detector shows a dark current density of 7.35 105 A/cm2 under the bias of 0.1 V, the responsivity of 0.88 A/W, and a specific detectivity of 4.69 1011 cm Hz1/2/W at 1510 nm. Meanwhile, the dark current density of eSWIR sub-detector is 8.68 104 A/cm2 under 0.4 V with the corresponding responsivity of 0.21 A/W, and a specific detectivity of 1.851010 cmHz1/2/W at 2 m. Furthermore, a single-pixel imaging system is built to demonstrate the capability of dual-band detectors in information capturing and target recognition.
engineering, electrical & electronic,optics,telecommunications