Grain-Size Effect On Pressure-Induced Semiconductor-To-Metal Transition In Zns

jianzhong jiang,l gerward,daniel j frost,richard a secco,j peyronneau,j s olsen
DOI: https://doi.org/10.1063/1.371631
IF: 2.877
1999-01-01
Journal of Applied Physics
Abstract:The grain-size effect on the semiconductor-to-metal transition in ZnS has been investigated by in situ high-pressure electrical resistance and optical measurements. It is found that the grain-size effect can elevate the transition pressure of ZnS in a larger pressure range. On the basis of the results obtained and results reported in the literature, we demonstrate that the dangers of using the transition pressures of the II-VI compounds as pressure calibrators without a detailed knowledge of their grain-size effects on the transition pressures cannot be overstressed. (C) 1999 American Institute of Physics. [S0021-8979(99)03922-5].
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