Micro-Raman Spectroscopy and Cathodoluminescence Study of Cross-section of Diamond Film

Chunlei Wang,Akimitsu Hatta,Jonghan Won,Nan Jiang,Toshimichi Ito,T. Sasaki,Akio Hiraki,Zengsun Jin,Guangtian Zou
1997-01-01
Abstract:Diamond film (24 ㎛) were prepared by Microwave Plasma Chemical Vapor Deposition method from a reactiv CO/H₂ mixtures. Micro-Raman spectroscopy and micro-cathodoluminescene study were carried out along the cross-section and correlated to SEM observation. CL image of cross-section was also investigated. Peak position, FWHM of Raman spectrum were determined using Lorentzian fit. The stress in this sample is 0.4-0.7 ㎬ compressive stress, and along the distance the compressive stress reduced. The Raman peak broadening is dominated by phonon life time reduction at grain boundaries and defect sites. Defects and impurities were mainly pressent inside the film, not at Silicon/Diamond interface.
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