Goos–Hänchen Shift of the Reflected Beam in a Standing-Wave Coupled Electromagnetically Induced Transparency System

Xiao-Jun Zhang,Hai-Hua Wang,Zhi-Peng Liang,Yan Xu,Cun-Bo Fan,Cheng-Zhi Liu,Jin-Yue Gao
DOI: https://doi.org/10.1103/physreva.91.033831
2015-01-01
Journal of the Optical Society of America B
Abstract:The Goos-Hanchen shift of the system composed by two cavity walls and an intracavity atomic sample is presented. The atomic sample is treated as a four-level double-Lambda system, driven by the two counterpropagating coupling fields. The probe field experiences the discontinuous refractive index variation and is reflected. Moreover, under the phase-matching condition, the four-wave mixing effect based on electromagnetically induced transparency can cause effective reflection. The Goos-Hanchen shifts appear in both situations and are carefully investigated in this article. We refer to the first one with the incident and reflected light having identical wavelength as the linear Goos-Hanchen shift, and the second one with the reflection wavelength determined by the phase-matching condition as the nonlinear Goos-Hanchen shift. The differences between the two kinds of shifts, such as the incident angle range, conditions for the shift peaks, and controllability, are discussed.
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