Laser flash Raman spectroscopy method for thermophysical characterization of 2D nanomaterials

qinyi li,xing zhang,yudong hu

DOI: https://doi.org/10.1016/j.tca.2014.08.011

IF: 3.5

2014-01-01

Thermochimica Acta

Abstract:•We develop a transient laser flash Raman spectroscopy method for 2D nanomaterials.•Laser absorption is eliminated by normalization.•Neglecting thermal contact resistance results in 1% uncertainty.

What problem does this paper attempt to address?

Laser Flash Raman Spectroscopy Method for Characterizing Thermal Diffusivity of Supported 2D Nanomaterials

Qin-Yi Li,Xing Zhang

DOI: https://doi.org/10.1016/j.ijheatmasstransfer.2015.12.065

IF: 5.2

2016-01-01

International Journal of Heat and Mass Transfer

Abstract:2D nanomaterials have been attracting extensive research interests due to their superior properties and the accurate thermophysical characterization of 2D materials is very important for nanoscience and nanotechnology. Recently, a noncontact technique based on the temperature dependent Raman band shifts has been used to measure the thermal conductivity of 2D materials. However, the heat flux, i.e. the absorbed laser power, was either theoretically estimated or measured by a laser power meter with uncertainty, resulting in large errors in thermal conductivity determination. This paper presents a transient “laser flash Raman spectroscopy” method for measuring the thermal diffusivity of 2D nanomaterials in both the suspended and supported forms without knowing laser absorption. Square pulsed laser instead of continuous laser is used to heat the sample and the laser absorption can be eliminated by comparing the measured temperature rises for different laser heating time and laser spot radii. This method is sensitive for characterizing typical 2D materials and useful for nanoscale heat transfer research.
Laser Flash Raman Spectroscopy Method for Characterizing the Specific Heat of a Single Nanoparticle.

Aoran Fan,Qinyi Li,Weigang Ma,Xing Zhang

DOI: https://doi.org/10.1166/jnn.2019.16626

2019-01-01

Journal of Nanoscience and Nanotechnology

Abstract:Nanoparticles are widely used in composite materials, nanoscale devices, biological detectors and medical treatment. The thermophysical properties of a single nanoparticle are, therefore, important for both nanotechnology and nanoscience applications. However, property measurements are limited by the spatial resolution of conventional measurement methods, so there are not yet any effective measurement methods to characterize the thermophysical properties of a single nanoparticle. This paper describes a laser flash Raman spectroscopy method for measuring the specific heat of a single nanoparticle supported on a free-standing substrate based on a lumped parameter model for the nanoparticle coupled with a transient 2D thermal conduction model for the suspended substrate. A series of square laser pulses are assumed to be used to heat the supported single nanoparticle in a vacuum. The temperature increases in the single nanoparticle and the suspended substrate are then measured based on their Raman band shifts. The laser absorption coefficients of the nanoparticle and the substrate are then eliminated by comparing the temperature increases measured using different laser pulse widths. The specific heat of the nanoparticle and the thermal contact conductance between the nanoparticle and the substrate can then be extracted by fitting the temperatures of both the nanoparticle and the substrate. Case studies show that the method can accurately measure the specific heat of a single nanoparticle about 100 nm in diameter using ~1 ns pulse widths. The influence of the nanoparticle geometry and the thermophysical properties of the substrate are also discussed.
Two-Step Dual-Wavelength Flash Raman Mapping Method for Measuring Thermophysical Properties of Supported Two-Dimensional Nanomaterials

Aoran Fan,Haidong Wang,Weigang Ma,Xing Zhang

DOI: https://doi.org/10.1080/01457632.2021.2000478

IF: 2.3

2021-01-01

Heat Transfer Engineering

Abstract:To determine the thermophysical properties of supported two-dimensional nanomaterials, this paper developed a two-step dual-wavelength flash Raman mapping method. The thermal conductivity of the supported two-dimensional nanomaterial and the thermal contact conductance between the sample and the substrate can be determined by steady-state step. And then the thermal diffusivity of the sample can be characterized by the transient step. Two models are also proposed in this paper. When the substrate temperature rises obviously, a full model considered the substrate temperature distribution is used to decouple the thermal diffusivity, thermal conductivity, and the thermal contact conductance. When the maximum substrate temperature rise is less than 20% of the maximum sample temperature rise, the temperature distribution and variation of the substrate is assumed proportionate to the sample, and then a simplified model can be used to analyze the thermal diffusivity and the other parameters. For the thermal diffusivity, the system error caused by simplifying assumptions is less than 1%, when a dimensionless parameter related to the thermal contact conductance and the thermal conductivity less than 1 and the maximum temperature rise of the substrate less than 15% of that of the supported sample.
Two-step Dual-wavelength Flash Raman Mapping Method for Measuring Thermophysical Properties of Supported 2D Nanomaterials

Aoran Fan,Haidong Wang,Weigang Ma,Xing Zhang

DOI: https://doi.org/10.48550/arXiv.2109.00143

2021-09-01

Abstract:The thermophysical properties of supported and free-standing nanomaterials would be different due to the substrate effect. To determine the thermophysical properties of supported 2D nanomaterials, this paper developed a two-step dual-wavelength flash Raman (DFR) mapping method. The thermal conductivity of the supported 2D nanomaterial and the thermal contact conductance between the sample and the substrate can be determined by steady-state step. And then the thermal diffusivity of the sample can be characterized by the transient step. Two models are also proposed in this paper. When the substrate temperature rises obviously, a full model considered the substrate temperature distribution is used to decouple the thermal diffusivity, thermal conductivity, and the thermal contact conductance. When the maximum substrate temperature rise is less than 20% of the maximum sample temperature rise, the temperature distribution and variation of the substrate is assumed proportionate to the sample, and then a simplified model can be used to analyse the thermal diffusivity and the other parameters. For the thermal diffusivity, the system error caused by simplifying assumptions is less than 1%, when a dimensionless parameter related to the thermal contact conductance and the thermal conductivity less than 1 and the maximum temperature rise of the substrate less than 15% of that of the supported sample.

Instrumentation and Detectors,Applied Physics
Laser flash-Raman spectroscopy method for the measurement of the thermal properties of micro/nano wires

Jinhui Liu,Haidong Wang,Yudong Hu,Weigang Ma,Xing Zhang

DOI: https://doi.org/10.1063/1.4904868

Abstract:This paper introduces a new method for measuring the thermal diffusivity and thermal conductivity of individual micro/nano wires using Raman spectroscopy. This method uses a focused short pulsed laser and a continuous-wave laser in a Raman spectroscopy system as the local heater, Raman signal excitation source, and temperature sensor. Unsteady and steady thermal conduction models are used to get two independent equations for the thermal diffusivity (α) and laser absorptivity (η). This new method is verified by comparing experimental results for graphite carbon fiber with measurement using the 3ω method. The method was then used to measure the temperature dependent thermal diffusivity and thermal conductivity of individual carbon nanotubes.
Distinguish Optical and Acoustic Phonon Temperatures of Supported 2D Materials by Nanosecond Time-Resolved Raman Scattering

Mahya Rahbar,Ibrahim Al Keyyam,Jing Liu,Xinwei Wang

DOI: https://doi.org/10.1364/ol.532999

IF: 3.6

2024-01-01

Optics Letters

Abstract:Upon laser irradiation, 2D materials experience a cascading energy transfer from electrons to optical phonons (OPs) and then to acoustic phonons (APs), resulting in a significant thermal non-equilibrium among energy carriers. This non-equilibrium presents challenges for Raman-based thermal characterization, as Raman scattering measures only OP temperature rise, while APs are the primary energy carriers. Despite recent efforts to address this issue, OP-AP thermal non-equilibrium in supported 2D materials remains poorly resolved. Here, we develop a method to distinguish the OP and AP temperature rises based on their different temporal thermal responses under laser irradiation: the OP-AP temperature difference responds almost immediately (∼a few to tens of ps), while the AP temperature rise takes longer to establish (∼tens of ns). Using energy transport-state resolved Raman, we probe the transient thermal response of Si-supported nm-thick MoS2 from 20 to 100 ns. We find that the OP-AP temperature difference exceeds 120% of the AP temperature rise under ∼0.439 µm radius laser heating. The intrinsic interfacial thermal conductance of the samples, based on the true AP temperature rise, varies from 0.199 to 1.46 MW·m-2·K-1, showing an increasing trend with sample thickness.
Suspended 2D Anisotropic Materials Thermal Diffusivity Measurements Using Dual-Wavelength Flash Raman Mapping Method

Yufeng Zhang,Aoran Fan,Shuting Luo,Haidong Wang,Weigang Ma,Xing Zhang

DOI: https://doi.org/10.1016/j.ijheatmasstransfer.2019.118795

IF: 5.2

2019-01-01

International Journal of Heat and Mass Transfer

Abstract:This paper presents a dual-wavelength flash Raman (DFR) mapping method for characterizing the thermal diffusivity of suspended 2D anisotropic materials. Using one heating laser beam and another probing laser beam with different wavelength, the crystal orientation can be determined by steady-state temperature map. Then modulating the two continuous wave laser beams into periodic pulsed laser beams, the transient heating and cooling curves at various positions along principle axes can be measured by varying the delay time between two pulsed laser beams and changing the position of the probing laser spot. The temporal resolution can reach 100 ps while the spatial resolution can reach 50 nm which are significantly better measurement accuracies. Phase processing method and optimal measurement positions of various thermal diffusivities were presented to further reduce the uncertainty. The effect of the laser absorption coefficient can be eliminated and no other physical parameters are required unlike in existing methods. Feasibility analysis verified that this method is applicable to ultrathin 2D anisotropic materials and even for monolayer materials. When the probing spots are selected around the optimal positions, the measurement uncertainty can be within ±5%.
Dual-Wavelength Laser Flash Raman Spectroscopy Method for In-Situ Measurements of the Thermal Diffusivity: Principle and Experimental Verification

Aoran Fan,Yudong Hu,Weigang Ma,Haidong Wang,Xing Zhang

DOI: https://doi.org/10.1007/s11630-019-1084-x

IF: 2.013

2019-01-01

Journal of Thermal Science

Abstract:This paper presents an in-situ, non-contact, non-destructive "dual-wavelength laser flash Raman spectroscopy method" for measuring the thermal diffusivity. In this method, a heating pulse is used to heat the sample and another pulsed laser with a different wavelength and negligible heating effect is used as a probe to measure the sample temperature changes during the heating and cooling periods from the Raman peak shifts. The sample temperature rise and fall curves are measured by changing the delay between the heating pulse and the probing pulse with the thermal diffusivity then characterized by fitting the temperature curves. The time delay between the heating and probing pulses can be precisely controlled with a minimum step of 100 ps. Hence, the temperature variation can be scanned with an ultra-high temporal resolution of up to 100 ps, which significantly improves the measurement accuracy of transient thermal parameters. The measurement accuracy of this method has been verified using a bulk material model and experiments. The measured thermal diffusivity of a silicon sample has been obtained to be 8.8×10 -5 m 2 /s with a 3% difference between the measured value and the average result for bulk silicon in the literature which verifies the reliability and accuracy of this method.
Spotting the Differences in Two-Dimensional Materials - the Raman Scattering Perspective.

Shishu Zhang,Na Zhang,Yan Zhao,Ting Cheng,Xiaobo Li,Rui Feng,Hua Xu,Zhirong Liu,Jin Zhang,Lianming Tong

DOI: https://doi.org/10.1039/c7cs00874k

IF: 46.2

2018-01-01

Chemical Society Reviews

Abstract:Two-dimensional (2D) layered materials have attracted tremendous attention and led to a prosperous development in both fundamental investigation and device applications in various fields, such as nanoelectronics, flexible devices, sustainable energy and catalysts. The precise characterization of the structure and properties of 2D materials is in urgent need. Raman scattering spectroscopy is one of the most popular characterization tools that is convenient, rapid and non-invasive. It provides information on both the lattice structure from the frequency of phonon modes and the electronic band structure through the intensity due to electronic resonance Raman scattering. Although a few morphological characterization tools can image 2D materials with atomic resolution, Raman scattering measurements are more tolerant to the conditions of sample preparation such as the substrate and less technically demanding, and have been one of the routine tools for the characterization of 2D materials. In this review, we focus on the characterization of 2D materials using Raman scattering spectroscopy, in particular, the revealing of differences from primitive 2D materials, such as defects, doping effects, van der Waals heterostructures and the interaction with molecules. The characteristic Raman features of such differences and the corresponding interpretation will be discussed. We hope that this review will be useful for wide research communities of materials, physics, chemistry and engineering.
T-type Raman spectroscopy method for determining laser absorption, thermal conductivity and air heat transfer coefficient of micro/nano fibers

Qinyi Li,Xing Zhang

DOI: https://doi.org/10.1016/j.tca.2014.01.023

IF: 3.5

2014-01-01

Thermochimica Acta

Abstract:•We develop a non-contact method to measure micro/nano fibers’ thermal properties.•We realize combined measurement of three properties using one sample.•Laser absorption is accurately determined by the nanosensor temperature rise.•Thermal contact resistance is easily eliminated by moving the laser spot.•The air heat transfer coefficient is determined with high sensitivity and accuracy.
Measurement Of The Thermal Conductivities Of Suspended Mos2 And Mose2 By Nanosecond Et-Raman Without Temperature Calibration And Laser Absorption Evaluation

Ridong Wang,Tianyu Wang,Hamidreza Zobeiri,Pengyu Yuan,Cheng Deng,Yanan Yue,Shen Xu,Xinwei Wang

DOI: https://doi.org/10.1039/c8nr05641b

IF: 6.7

2018-01-01

Nanoscale

Abstract:Steady state Raman spectroscopy is the most widely used opto-thermal technique for measuring a 2D atomic-layer material's thermal conductivity. It requires the calibration of temperature coefficients of Raman properties and measurement/calculation of the absolution laser absorption in 2D materials. Such a requirement is very laborious and introduces very large measurement errors (of the order of 100%) and hinders gaining a precise and deep understanding of phonon-structure interactions in 2D materials. In this work, a novel nanosecond energy transport state resolved Raman (ns ET-Raman) technique is developed to resolve these critical issues and achieve unprecedented measurement precision, accuracy and ease of implementation. In ns ET-Raman, two energy transport states are constructed: steady state and nanosecond thermal transport and Raman probing. The ratio of the temperature rise under the two states eliminates the need for Raman temperature calibration and laser absorption evaluation. Four suspended MoS2 (45-115 nm thick) and four suspended MoSe2 (45-140 nm thick) samples are measured and compared using ns ET-Raman. With the increase of the sample thickness, the measured thermal conductivity increases from 40.0 +/- 2.2 to 74.3 +/- 3.2 W m(-1) K-1 for MoS2, and from 11.1 +/- 0.4 to 20.3 +/- 0.9 W m(-1) K-1 for MoSe2. This is attributed to the decreased significance of surface phonon scattering in thicker samples. The ns ET-Raman features the most advanced capability to measure the thermal conductivity of 2D materials and will find broad applications in studying low-dimensional materials.
Frequency-domain Raman Method to Measure Thermal Diffusivity of One-Dimensional Microfibers and Nanowires

Qin-Yi Li,Koji Takahashi,Xing Zhang

DOI: https://doi.org/10.1016/j.ijheatmasstransfer.2019.01.057

IF: 5.2

2019-01-01

International Journal of Heat and Mass Transfer

Abstract:Thermal property measurement of individual micro- and nano-materials has been very challenging and the development of measurement methods is crucial for the experimental investigation of microscale and nanoscale heat transfer. Here we present a noncontact frequency-domain Raman method to measure thermal diffusivity of individual 1D microfibers and nanowires without the need of knowing laser absorptivity. Cosine-wave modulated laser is used to heat the sample, while the laser-intensity-weighted spatiotemporal average temperature is simultaneously detected from the sample's Raman band shift. Transient heat conduction models under periodic heating are established and analytically solved in the frequency domain with considerations of the Gaussian laser distribution and thermal contact resistance. By varying the laser modulation frequency as well as the laser spot size, we can eliminate the laser absorptivity by a normalization technique and extract the thermal diffusivity with high sensitivity. Typically, if the thermal diffusivity is on the order of 10(-4) m(2)/s, we need to use the modulation frequencies on the order of 10 Hz to measure millimeter long microfibers, and similar to MHz frequencies to measure micrometer long nanowires. We also demonstrate that any kind of periodic laser modulation can be decomposed to a series of cosine modes and readily analyzed by this frequency-domain approach, which can greatly broaden the applications of transient Raman techniques. (C) 2019 Elsevier Ltd. All rights reserved.
Research advance of measurement of thermo-physical property of micro-nano material with femtosecond laser

Shengquan XIA,Xuechao Lü,Xiaobo WANG,Jianjun HE,Wei WANG,Zhengping DOU

DOI: https://doi.org/10.7510/jgjs.issn.1001-3806.2016.04.011

2016-01-01

Abstract:With the development of micro-nano fabrication, the measurement of thermo-physical property of micro-nano material becomes more significant. At first, the basic principle of measurement of the thermo-physical property of micro-nano material with femtosecond laser and the means of realization were introduced. And then, two-temperature model, hyperbolic two-step model, hyperbolic one-step model, parabolic one-step model, dual-phase-lag model and parabolic two-step model were compared. Secondly, the characteristics of the measurement of the thermo-physical property of micro-nano material with femtosecond laser were introduced. Thirdly, three common system such as single-color femtosecond laser pump in front and probe system, two-color femtosecond laser pump in front and probe system, and single-color femtosecond laser pump and probe system in different side were introduced. Finally, the direction of future research in measurement of the thermo-physical property of materials was pointed out.
Thermal Behavior of Materials in Laser-Assisted Extreme Manufacturing: Raman-based Novel Characterization

Ridong Wang,Shen Xu,Yanan Yue,Xinwei Wang

DOI: https://doi.org/10.1088/2631-7990/aba17c

2020-01-01

International Journal of Extreme Manufacturing

Abstract:Laser-assisted manufacturing (LAM) is a technique that performs machining of materials using a laser heating process. During the process, temperatures can rise above over 2000 °C. As a result, it is crucial to explore the thermal behavior of materials under such high temperatures to understand the physics behind LAM and provide feedback for manufacturing optimization. Raman spectroscopy, which is widely used for structure characterization, can provide a novel way to measure temperature during LAM. In this review, we discuss the mechanism of Raman-based temperature probing, its calibration, and sources of uncertainty/error, and how to control them. We critically review the Raman-based temperature measurement considering the spatial resolution under near-field optical heating and surface structure-induced asymmetries. As another critical aspect of Raman-based temperature measurement, temporal resolution is also reviewed to cover various ways of realizing ultrafast thermal probing. We conclude with a detailed outlook on Raman-based temperature probing in LAM and issues that need special attention.
Distinguishing optical and acoustic phonon temperatures of supported 2D materials by nanosecond time-resolved Raman scattering

Mahya Rahbar,Ibrahim Al Keyyam,Jing Liu,Xinwei Wang

DOI: https://doi.org/10.1364/ol.532999

IF: 3.6

2024-08-31

Optics Letters

Abstract:Mahya Rahbar, Ibrahim Al Keyyam, Jing Liu, Xinwei Wang Upon laser irradiation, 2D materials experience a cascading energy transfer from electrons to optical phonons (OPs) and then to acoustic ... [Opt. Lett. 49, 4971-4974 (2024)]

optics
A novel high resolution contactless technique for thermal field mapping and thermal conductivity determination: Two-Laser Raman Thermometry

J. S. Reparaz,E. Chavez-Angel,M. R. Wagner,B. Graczykowski,J. Gomis-Bresco,F. Alzina,C. M. Sotomayor Torres

DOI: https://doi.org/10.48550/arXiv.1312.7705

2013-12-30

Materials Science

Abstract:We present a novel high resolution contactless technique for thermal conductivity determination and thermal field mapping based on creating a thermal distribution of phonons using a heating laser, while a second laser probes the local temperature through the spectral position of a Raman active mode. The spatial resolution can be as small as $300$ nm, whereas its temperature accuracy is $\pm 2$ K. We validate this technique investigating the thermal properties of three free-standing single crystalline Si membranes with thickness of 250, 1000, and 2000 nm. We show that for 2-dimensional materials such as free-standing membranes or thin films, and for small temperature gradients, the thermal field decays as $T(r) \propto ln(r)$ in the diffusive limit. The case of large temperature gradients within the membranes leads to an exponential decay of the thermal field, $T \propto exp[-A \cdot ln(r)]$. The results demonstrate the full potential of this new contactless method for quantitative determination of thermal properties. The range of materials to which this method is applicable reaches far beyond the here demonstrated case of Si, as the only requirement is the presence of a Raman active mode.
Nanosecond nanothermometry in an electron microscope

Florian Castioni,Yves Auad,Jean-Denis Blazit,Xiaoyan Li,Steffi Y. Woo,Kenji Watanabe,Takashi Taniguchi,Ching-Hwa Ho,Odile Stéphan,Mathieu Kociak,Luiz H.G. Tizei

2024-11-12

Abstract:Thermal transport in nanostructures plays a critical role in modern technologies. As devices shrink, techniques that can measure thermal properties at nanometer and nanosecond scales are increasingly needed to capture transient, out-of-equilibrium phenomena. We present a novel pump-probe photon-electron method within a scanning transmission electron microscope (STEM) to map temperature dynamics with unprecedented spatial and temporal resolutions. By combining focused laser-induced heating and synchronized time-resolved monochromated electron energy loss spectroscopy (EELS), we track phonon, exciton and plasmon signals in various materials, including silicon nitride, aluminum thin film, and transition metal dichalcogenides. Our results demonstrate the technique's ability to follow temperature changes at the nanometer and nanosecond scales. The experimental data closely matched theoretical heat diffusion models, confirming the method's validity. This approach opens new opportunities to investigate transient thermal phenomena in nanoscale materials, offering valuable insights for applications in thermoelectric devices and nanoelectronics.

Materials Science
Robust and High-Sensitivity Thermal Probing at the Nanoscale Based on Resonance Raman Ratio (R3)

Hamidreza Zobeiri,Nicholas Hunter,Shen Xu,Yangsu Xie,Xinwei Wang

DOI: https://doi.org/10.1088/2631-7990/ac6cb1

2022-01-01

International Journal of Extreme Manufacturing

Abstract:Raman spectroscopy-based temperature sensing usually tracks the change of Raman wavenumber, linewidth and intensity, and has found very broad applications in characterizing the energy and charge transport in nanomaterials over the last decade. The temperature coefficients of these Raman properties are highly material-dependent, and are subjected to local optical scattering influence. As a result, Raman-based temperature sensing usually suffers quite large uncertainties and has low sensitivity. Here, a novel method based on dual resonance Raman phenomenon is developed to precisely measure the absolute temperature rise of nanomaterial (nm WS2 film in this work) from 170 to 470 K. A 532 nm laser (2.33 eV photon energy) is used to conduct the Raman experiment. Its photon energy is very close to the excitonic transition energy of WS2 at temperatures close to room temperature. A parameter, termed resonance Raman ratio (R3) Omega = I-A1g/I-E2g , is introduced to combine the temperature effects on resonance Raman scattering for the A(1g) and E-2g modes. Omega has a change of more than two orders of magnitude from 177 to 477 K, and such change is independent of film thickness and local optical scattering. It is shown that when Omega is varied by 1%, the temperature probing sensitivity is 0.42 K and 1.16 K at low and high temperatures, respectively. Based on Omega, the in-plane thermal conductivity (k) of a similar to 25 nm-thick suspended WS2 film is measured using our energy transport state-resolved Raman (ET-Raman). k is found decreasing from 50.0 to 20.0 Wm(-1) K-1 when temperature increases from 170 to 470 K. This agrees with previous experimental and theoretical results and the measurement data using our EET-Raman. The R3 technique provides a very robust and high-sensitivity method for temperature probing of nanomaterials and will have broad applications in nanoscale thermal transport characterization, non-destructive evaluation, and manufacturing monitoring.
Dual-wavelength flash Raman mapping method for measuring the thermal diffusivity of a single supported nanowire

Shuting Luo,Aoran Fan,Yufeng Zhang,Haidong Wang,Weigang Ma,Xing Zhang

DOI: https://doi.org/10.1016/j.ijheatmasstransfer.2021.122271

IF: 5.2

2022-03-01

International Journal of Heat and Mass Transfer

Abstract:The heat dissipation of electronic devices has become an enormous challenge with the dramatic increasing of integrated transistors on a chip. Nanowires are viewed as promising materials for solving this problem. The accurate measurement of thermal diffusivity is a precondition for further applications. This paper presents a non-destructive method to measure the thermal diffusivity of a single supported nanowire, which is called dual-wavelength flash Raman (DFR) mapping method. This method has a 100 ps temporal resolution based on the minimum time delay between the heating and probing laser pulses and 50 nm spatial resolution based on the minimum step of the probing pulse. Compared with previously proposed concentric DFR method, the probing pulse can move along the nanwire length and the movable probing laser beam allowed temperature measurements at the most sensitive position,which improves the measurement accuracy by 50%. Moreover, instead of the normalizaiton temperature method in concentric DFR method, a temperature phase method was proposed for analyzing the temperature variation curves. The measurements on a single supported silicon nanowire verified the reliability of the DFR mapping method. One thousand virtual experiments showed that the uncertainty of this method can achieve ±5%.

engineering, mechanical,thermodynamics,mechanics
Measurement of the Thermal Transport Properties of Dielectric Thin Films Using the Micro-Raman Method

Shuo Huang,Xiao-dong Ruan,Xin Fu,Hua-yong Yang

DOI: https://doi.org/10.1631/jzus.a0820493

2009-01-01

Abstract:The micro-Raman method is a non-contact and non-destructive method for thermal conductivity measurement. To reduce the measurement error induced by the poor fit of the basic equation of the original micro-Raman method, we developed a new basic equation for the heat source of a Gaussian laser beam. Based on the new basic equation, an analytical heat transfer model has been built to extend the original micro-Raman method to thin films with submicrometer- or nanometer-scale thickness. Experiments were performed to measure the thermal conductivity of dielectric thin films with submicrometer- or nanometer-scale thickness. The thermal resistance of the interface between dielectric thin films and their silicon substrate was also obtained. The obtained thermal conductivity of silicon dioxide film is 1.23 W/(m·K), and the interface thermal resistance between silicon dioxide film and substrate is 2.35×10−8 m2·K/W. The thermal conductivity and interface thermal resistance of silicon nitride film are 1.07 W/(m·K) and 3.69×10−8 m2·K/W, respectively. The experimental results are consistent with reported data.

Laser flash Raman spectroscopy method for thermophysical characterization of 2D nanomaterials

Laser Flash Raman Spectroscopy Method for Characterizing Thermal Diffusivity of Supported 2D Nanomaterials

Laser Flash Raman Spectroscopy Method for Characterizing the Specific Heat of a Single Nanoparticle.

Two-Step Dual-Wavelength Flash Raman Mapping Method for Measuring Thermophysical Properties of Supported Two-Dimensional Nanomaterials

Two-step Dual-wavelength Flash Raman Mapping Method for Measuring Thermophysical Properties of Supported 2D Nanomaterials

Laser flash-Raman spectroscopy method for the measurement of the thermal properties of micro/nano wires

Distinguish Optical and Acoustic Phonon Temperatures of Supported 2D Materials by Nanosecond Time-Resolved Raman Scattering

Suspended 2D Anisotropic Materials Thermal Diffusivity Measurements Using Dual-Wavelength Flash Raman Mapping Method

Dual-Wavelength Laser Flash Raman Spectroscopy Method for In-Situ Measurements of the Thermal Diffusivity: Principle and Experimental Verification

Spotting the Differences in Two-Dimensional Materials - the Raman Scattering Perspective.

T-type Raman spectroscopy method for determining laser absorption, thermal conductivity and air heat transfer coefficient of micro/nano fibers

Measurement Of The Thermal Conductivities Of Suspended Mos2 And Mose2 By Nanosecond Et-Raman Without Temperature Calibration And Laser Absorption Evaluation

Frequency-domain Raman Method to Measure Thermal Diffusivity of One-Dimensional Microfibers and Nanowires

Research advance of measurement of thermo-physical property of micro-nano material with femtosecond laser

Thermal Behavior of Materials in Laser-Assisted Extreme Manufacturing: Raman-based Novel Characterization

Distinguishing optical and acoustic phonon temperatures of supported 2D materials by nanosecond time-resolved Raman scattering

A novel high resolution contactless technique for thermal field mapping and thermal conductivity determination: Two-Laser Raman Thermometry

Nanosecond nanothermometry in an electron microscope

Robust and High-Sensitivity Thermal Probing at the Nanoscale Based on Resonance Raman Ratio (R3)

Dual-wavelength flash Raman mapping method for measuring the thermal diffusivity of a single supported nanowire

Measurement of the Thermal Transport Properties of Dielectric Thin Films Using the Micro-Raman Method