Precision Measurement of the D^*0 Decay Branching Fractions

M. Ablikim,M. N. Achasov,X. C. Ai,O. Albayrak,M. Albrecht,D. J. Ambrose,A. Amoroso,F. F. An,Q. An,J. Z. Bai,R. Baldini Ferroli,Y. Ban,D. W. Bennett,J. V. Bennett,M. Bertani,D. Bettoni,J. M. Bian,F. Bianchi,E. Boger,O. Bondarenko,I. Boyko,R. A. Briere,H. Cai,X. Cai,O. Cakir,A. Calcaterra,G. F. Cao,S. A. Cetin,J. F. Chang,G. Chelkov,G. Chen,H. S. Chen,H. Y. Chen,J. C. Chen,M. L. Chen,S. J. Chen,X. Chen,X. R. Chen,Y. B. Chen,H. P. Cheng,X. K. Chu,G. Cibinetto,D. Cronin-Hennessy,H. L. Dai,J. P. Dai,A. Dbeyssi,D. Dedovich,Z. Y. Deng,A. Denig,I. Denysenko,M. Destefanis,F. De Mori,Y. Ding,C. Dong,J. Dong,L. Y. Dong,M. Y. Dong,S. X. Du,P. F. Duan,J. Z. Fan,J. Fang,S. S. Fang,X. Fang,Y. Fang,L. Fava,F. Feldbauer,G. Felici,C. Q. Feng,E. Fioravanti,M. Fritsch,C. D. Fu,Q. Gao,Y. Gao,I. Garzia,K. Goetzen,W. X. Gong,W. Gradl,M. Greco,M. H. Gu,Y. T. Gu,Y. H. Guan,A. Q. Guo,L. B. Guo,T. Guo,Y. Guo,Y. P. Guo,Z. Haddadi,A. Hafner,S. Han,Y. L. Han,F. A. Harris,K. L. He,Z. Y. He,T. Held,Y. K. Heng,Z. L. Hou,C. Hu,H. M. Hu,J. F. Hu,T. Hu,Y. Hu,G. M. Huang,G. S. Huang,H. P. Huang,J. S. Huang,X. T. Huang,Y. Huang,T. Hussain,Q. Ji,Q. P. Ji,X. B. Ji,X. L. Ji,L. L. Jiang,L. W. Jiang,X. S. Jiang,J. B. Jiao,Z. Jiao,D. P. Jin,S. Jin,T. Johansson,A. Julin,N. Kalantar-Nayestanaki,X. L. Kang,X. S. Kang,M. Kavatsyuk,B. C. Ke,R. Kliemt,B. Kloss,O. B. Kolcu,B. Kopf,M. Kornicer,W. Kuehn,A. Kupsc,W. Lai,J. S. Lange,M. Lara,P. Larin,C. H. Li,Cheng Li,D. M. Li,F. Li,G. Li,H. B. Li,J. C. Li,Jin Li,K. Li,P. R. Li,T. Li,W. D. Li,W. G. Li,X. L. Li,X. M. Li,X. N. Li,X. Q. Li,Z. B. Li,H. Liang,Y. F. Liang,Y. T. Liang,G. R. Liao,D. X. Lin,B. J. Liu,C. L. Liu,C. X. Liu,F. H. Liu,Fang Liu,Feng Liu,H. B. Liu,H. H. Liu,H. M. Liu,J. Liu,J. P. Liu,J. Y. Liu,K. Liu,K. Y. Liu,L. D. Liu,P. L. Liu,Q. Liu,S. B. Liu,X. Liu,X. X. Liu,Y. B. Liu,Z. A. Liu,Zhiqiang Liu,Zhiqing Liu,H. Loehner,X. C. Lou,H. J. Lu,J. G. Lu,R. Q. Lu,Y. Lu,Y. P. Lu,C. L. Luo,M. X. Luo,T. Luo,X. L. Luo,M. Lv,X. R. Lyu,F. C. Ma,H. L. Ma,L. L. Ma,Q. M. Ma,S. Ma,T. Ma,X. N. Ma,X. Y. Ma,F. E. Maas,M. Maggiora,Q. A. Malik,Y. J. Mao,Z. P. Mao,S. Marcello,J. G. Messchendorp,J. Min,T. J. Min,R. E. Mitchell,X. H. Mo,Y. J. Mo,Morales,K. Moriya,N. Yu. Muchnoi,H. Muramatsu,Y. Nefedov,F. Nerling,I. B. Nikolaev,Z. Ning,S. Nisar,S. L. Niu,X. Y. Niu,S. L. Olsen,Q. Ouyang,S. Pacetti,P. Patteri,M. Pelizaeus,H. P. Peng,K. Peters,J. L. Ping,R. G. Ping,R. Poling,Y. N. Pu,M. Qi,S. Qian,C. F. Qiao,L. Q. Qin,N. Qin,X. S. Qin,Y. Qin,Z. H. Qin,J. F. Qiu,K. H. Rashid,C. F. Redmer,H. L. Ren,M. Ripka,G. Rong,X. D. Ruan,V. Santoro,A. Sarantsev,M. Savrie,K. Schoenning,S. Schumann,W. Shan,M. Shao,C. P. Shen,P. X. Shen,X. Y. Shen,H. Y. Sheng,M. R. Shepherd,W. M. Song,X. Y. Song,S. Sosio,S. Spataro,B. Spruck,G. X. Sun,J. F. Sun,S. S. Sun,Y. J. Sun,Y. Z. Sun,Z. J. Sun,Z. T. Sun,C. J. Tang,X. Tang,I. Tapan,E. H. Thorndike,M. Tiemens,D. Toth,M. Ullrich,I. Uman,G. S. Varner,B. Wang,B. L. Wang,D. Wang,D. Y. Wang,K. Wang,L. L. Wang,L. S. Wang,M. Wang,P. Wang,P. L. Wang,Q. J. Wang,S. G. Wang,W. Wang,X. F. Wang,Y. D. Wang,Y. F. Wang,Y. Q. Wang,Z. Wang,Z. G. Wang,Z. H. Wang,Z. Y. Wang,T. Weber,D. H. Wei,J. B. Wei,P. Weidenkaff,S. P. Wen,U. Wiedner,M. Wolke,L. H. Wu,Z. Wu,L. G. Xia,Y. Xia,D. Xiao,Z. J. Xiao,Y. G. Xie,G. F. Xu,L. Xu,Q. J. Xu,Q. N. Xu,X. P. Xu,L. Yan,W. B. Yan,W. C. Yan,Y. H. Yan,H. X. Yang,L. Yang,Y. Yang,Y. X. Yang,H. Ye,M. Ye,M. H. Ye,J. H. Yin,B. X. Yu,C. X. Yu,H. W. Yu,J. S. Yu,C. Z. Yuan,W. L. Yuan,Y. Yuan,A. Yuncu,A. A. Zafar,A. Zallo,Y. Zeng,B. X. Zhang,B. Y. Zhang,C. Zhang,C. C. Zhang,D. H. Zhang,H. H. Zhang,H. Y. Zhang,J. J. Zhang,J. L. Zhang,J. Q. Zhang,J. W. Zhang,J. Y. Zhang,J. Z. Zhang,K. Zhang,L. Zhang,S. H. Zhang,X. J. Zhang,X. Y. Zhang,Y. Zhang,Y. H. Zhang,Z. H. Zhang,Z. P. Zhang,Z. Y. Zhang,G. Zhao,J. W. Zhao,J. Y. Zhao,J. Z. Zhao,Lei Zhao,Ling Zhao,M. G. Zhao,Q. Zhao,Q. W. Zhao,S. J. Zhao,T. C. Zhao,Y. B. Zhao,Z. G. Zhao,A. Zhemchugov,B. Zheng,J. P. Zheng,W. J. Zheng,Y. H. Zheng,B. Zhong,L. Zhou,Li Zhou,X. Zhou,X. K. Zhou,X. R. Zhou,X. Y. Zhou,K. Zhu,K. J. Zhu,S. Zhu,X. L. Zhu,Y. C. Zhu,Y. S. Zhu,Z. A. Zhu,J. Zhuang,B. S. Zou,J. H. Zou
DOI: https://doi.org/10.1103/physrevd.91.031101
2015-01-01
Abstract:Using 482 pb(-1) of data taken at root s = 4.009 GeV, we measure the branching fractions of the decays of D*(0) into D-0 pi(0) and D-0 gamma to be B(D*(0) -> D-0 pi(0)) = (65.5 +/- 0.8 +/- 0.5)% and B(D*(0) -> D0 gamma) = (34.5 +/- 0.8 +/- 0.5)%, respectively, by assuming that the D*(0) decays only into these two modes. The ratio of the two branching fractions is B(D*(0) -> D-0 pi(0))/B(D*(0) -> D-0 gamma) = 1.90 +/- 0.07 +/- 0.05, which is independent of the assumption made above. The first uncertainties are statistical and the second ones systematic. The precision is improved by a factor of 3 compared to the present world average values.
What problem does this paper attempt to address?