High-precision Absolute Coordinate Measurement Using Frequency Scanned Interferometry

C. Tian-Xiang,Y. Hai-Jun,L. Cheng
DOI: https://doi.org/10.1088/1748-0221/9/03/p03001
2014-01-01
Journal of Instrumentation
Abstract:In this paper, we report high-precision absolute position measurement performed with frequency scanned interferometry (FSI). We reported previously on measurement of absolute distance with FSI [1]. Absolute position is determined by several related absolute distances measured simultaneously. The achieved precision of 2-dimensional measurements is better than 1 micron, and in 3-dimensional measurements, the precision on X and Y is confirmed to be below 1 micron, while the confirmed precision on Z is about 2 microns, where the confirmation is limited by the lower precision of the moving stage in Z direction.
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