Characterization of Microstructures and Defects in SrSmAlO4-Based Microwave Dielectric Ceramics by TEM

min min mao,lei li,y w zeng,xiang ming chen
DOI: https://doi.org/10.1080/00150193.2014.922849
2014-01-01
Ferroelectrics
Abstract:The microstructures and defects in SrSmAlO4-based microwave dielectric ceramics were investigated by TEM. The layer sequence defect was observed in Sm-rich SrSmAlO4 ceramics. The other type of intergrowth defect was observed in Sr/Ti co-substituted SrSmAlO4 ceramics, where the inhomogeneity of local area also appeared. The dislocation and secondary phase were present in Ti substituted (Sr0.3Ca0.7)SmAlO4 ceramics. In addition, the secondary phases were observed in the SrSmAlO4 ceramic with ZrO2 pollution and that was sintered at the elevated temperature. All these defects lead to an increase in extrinsic dielectric loss, which should be prevented by microstructural engineering.
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