A High-Throughput Imaging Spectrometer Based on Over-Scanning

Jiang Yue,Jing Han,Yi Zhang,Lian-fa Bai
DOI: https://doi.org/10.4028/www.scientific.net/amm.519-520.1247
2014-01-01
Abstract:We present a novel high-throughput imaging spectrometer based on over-scanning. The traditional slit-based spectrometer cannot gather enough radiation while the source is too weak. A much wider slit is used to replace the narrow one in traditional spectrometer. Too much wide slit will cause overlapping between different wavelength lights. In order to reconstruct super-resolution spectrum of source, over-scanning is employed which is realized by high precision electromechanical device. Experiments show that the reconstructed spectrum achieved a much higher resolution than original data meanwhile the throughput has improved significantly.
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