Abstract:Surfaces of metal oxides are of crucial importance for a variety of technological applications such as heterogeneous catalysis, thin film growth, gas sensing, and corrosion prevention [1]. Due to the complexities of oxides in crystal structure and electronic structure, however, the surface science of oxides lags far behind that of metals or semiconductors. Conventional surface-science techniques, typically scanning tunneling microscopy (STM) and low energy electron diffraction (LEED), are usually limited to surfaces of single crystals with relatively simple structures. Metal oxides are usually good insulators, either band insulators or Mott insulators, making them not suitable for STM, LEED, and most of spectroscopic methods using low energy electrons as probes. On the other hand, the complex atomic structures of oxides results in too many structural parameters to be determined by spectroscopy or diffraction methods. Recent developments in high-resolution transmission electron microscopy (TEM) provide us opportunities to overcome the above difficulties. With the realization of aberration-correction, the point resolution of TEM has been improved into the milestone 1 Angstrom scale. In addition, the correction of the spherical aberration has almost eliminated the contrast delocalization in high-resolution images. Therefore, high resolution TEM becomes an even more powerful tool than before for materials research at a truly atomic-scale. Here, we will present our recent works on atomic and electronic structure of oxide surfaces [2-3]. We will show that the structure and dynamics of oxide surfaces can be directly imaged and measured at the sub-angstrom scale with an accuracy of picometers, comparable to that obtained by conventional surface science techniques on single crystals.

Oxidation-State Sensitive Imaging of Cerium Dioxide by Atomic-Resolution Low-Angle Annular Dark Field Scanning Transmission Electron Microscopy

Low Angle Annular Dark Field Scanning Transmission Electron Microscopy is Sensitive to Oxidation State in CeO2 Nanoparticles

Deciphering the Ce3+ to Ce4+ Evolution: Insight from X‐ray Raman Scattering Spectroscopy at Ce N4,5 Edges

Electroluminescence from Metal-Oxide-semiconductor Devices with Erbium-Doped CeO2 Films on Silicon

Direct Measurement of the Crystallographically Sensitive Atomic Termination of Nanophase Cerium Dioxide

An AES Study of Initial Oxidation of Ce-La Alloy at Room Temperature and Low Oxygen Pressure

Imaging, Core-Loss, and Low-Loss Electron-Energy-Loss Spectroscopy Mapping in Aberration-Corrected STEM

An XPS study of the oxidation of reduced ceria–lanthana nanocrystals

Experiments on Oxidation and Combustion Behaviors of Cerium Metal Slice with Slow Heating under O2/Ar Atmospheric Conditions

Spatiotemporal characterization of cerium monoxide in laser ablation plasmas using spectrally-resolved fast-gated imaging

High-Resolution Stem and Eels As Tools to Study Structure and Bonding of Oxides

Fast Atomic-Scale Chemical Imaging of Crystalline Materials and Dynamic Phase Transformations.

A High Resolution Study of Dynamic Changes of Ce2O3 and CeO2 Nanoparticles in Complex Environmental Media.

Direct Atomic Imaging of Oxide Surfaces

Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides

Low-voltage single-atom electron microscopy with carbon-based nanomaterials

Quantitative HRTEM and its application in the study of oxide materials

In Situ TEM Studies of Oxygen Vacancy Migration for Electrically Induced Resistance Change Effect in Cerium Oxides.

Real-time Observation of Dynamic Process of Oxygen Vacancy Migration in Cerium Oxides under Electric Field

Electronic Structure Interpretation: How much do we understand the Ce L3 XANES?

Unraveling the “seesaw” Competition Between the Electrically Driven Reduction and Reoxidation Processes in Ceria with in Situ Electron Microscopy