Focus Characterization at an X-ray Free-Electron Laser by Coherent Scattering and Speckle Analysis.

Marcin Sikorski,Sanghoon Song,Andreas Schropp,Frank Seiboth,Yiping Feng,Roberto Alonso-Mori,Matthieu Chollet,Henrik T. Lemke,Dimosthenis Sokaras,Tsu-Chien Weng,Wenkai Zhang,Aymeric Robert,Diling Zhu
DOI: https://doi.org/10.1107/s1600577515004361
IF: 2.557
2015-01-01
Journal of Synchrotron Radiation
Abstract:X-ray focus optimization and characterization based on coherent scattering and quantitative speckle size measurements was demonstrated at the Linac Coherent Light Source. Its performance as a single-pulse free-electron laser beam diagnostic was tested for two typical focusing configurations. The results derived from the speckle size/shape analysis show the effectiveness of this technique in finding the focus' location, size and shape. In addition, its single-pulse compatibility enables users to capture pulse-to-pulse fluctuations in focus properties compared with other techniques that require scanning and averaging.
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