Robust Formation of Skyrmions and Topological Hall Effect Anomaly in Epitaxial Thin Films of MnSi.

Yufan Li,N. Kanazawa,X. Z. Yu,A. Tsukazaki,M. Kawasaki,M. Ichikawa,X. F. Jin,F. Kagawa,Y. Tokura
DOI: https://doi.org/10.1103/physrevlett.110.117202
IF: 8.6
2013-01-01
Physical Review Letters
Abstract:Magnetotransport properties have been investigated for epitaxial thin films of B20-type MnSi grown on Si(111) substrates. Lorentz transmission electron microscopy images clearly point to the robust formation of Skyrmions over a wide temperature-magnetic field region. New features distinct from those reported previously for MnSi are observed for epitaxial films: a shorter (nearly half) period of the spin helix and Skyrmions, and a topological Hall effect anomaly consisting in ∼2.2 times enhancement of the amplitude and in the opposite sign with respect to bulk samples.
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