Advances in the Far-Field Sub-Diffraction Limit Focusing and Super-Resolution Imaging by Planar Metalenses
Qin Fei,Hong Ming-Hui,Cao Yao-Yu,Li Xiang-Ping
DOI: https://doi.org/10.7498/aps.66.144206
IF: 0.906
2017-01-01
Acta Physica Sinica
Abstract:Due to the fundamental laws of wave optics, the spatial resolution of traditional optical microscopy is limited by the Rayleigh criterion. Enormous efforts have been made in the past decades to break through the diffraction limit barrier and in depth understand the dynamic processes and static properties. A growing array of super-resolution techniques by distinct approaches have been invented, which can be assigned to two categories: near-field and far-field super-resolution techniques. The near-field techniques, including near-field scanning optical microscopy, superlens, hyperlens, etc., could break through the diffraction limit and realize super-resolution imaging by collecting and modulating the evanescent wave. However, near-field technique suffers a limitation of very short working distances because of the confined propagation distance of evanescent wave, and certainly produces a mechanical damage to the specimen. The super-resolution fluorescence microscopy methods, such as STED, STORM, PALM, etc., could successfully surpass the diffractive limit in far field by selectively activating or deactivating fluorophores rooted in the nonlinear response to excitation light. But those techniques heavily rely on the properties of the fluorophores, and the labelling process makes them only suitable for narrow class samples. Developing a novel approach which could break through the diffraction limit in far field without any near-field operation or labelling processes is of significance for not only scientific research but also industrial production. Recently, the planar metalenses emerge as a promising approach, owing to the theoretical innovation, flexible design, and merits of high efficiency, integratable and so forth. In this review, the most recent progress of planar metalenses is briefly summarized in the aspects of sub-diffractive limit focusing and super-resolution imaging. In addition, the challenge to transforming this academic concept into practical applications, and the future development in the field of planar metalenses are also discussed briefly.