TIRF microscopy with ultra-short penetration depth.

Hao Shen,Eric Huang,Tapaswini Das,Hongxing Xu,Mark Ellisman,Zhaowei Liu
DOI: https://doi.org/10.1364/OE.22.010728
IF: 3.8
2014-01-01
Optics Express
Abstract:Total internal reflection fluorescence microscopy (TIRF), in both commercial and custom-built configurations, is widely used for high signal-noise ratio imaging. The imaging depth of traditional TIRF is sensitive to the incident angle of the laser, and normally limited to around 100 nm. In our paper, using a high refractive index material and the evanescent waves of various waveguide modes, we propose a compact and tunable ultra-short decay length TIRF system, which can reach decay lengths as short as 19 nm, and demonstrate its application for imaging fluorescent dye-labeled F-actin in HeLa cells. (C) 2014 Optical Society of America
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