Abstract:Thickness measurement is highly useful in industrials both for controlling the thickness of the product and for material characterization considering both mechanical and chemical properties. Longitudinal ultrasonic velocity can be used to measure material thickness provided that sufficient accuracy can be achieved. A new laser ultrasonic thickness measurement method based on spectral analysis was proposed in this paper and was used for accurate thickness measurement for metal plate. A one-layer model was introduced which laser ultrasonic transmits into, deducing the expression of ultrasonic reflection coefficient amplitude spectrum (URCAS), from which we obtained the method for metal plate thickness measurement; then a laser ultrasonic system was set up to receive the laser ultrasonic transmitting into the plate. Meanwhile we developed a new laser ultrasonic data processing algorithm so that the frequency values of the peaks in frequency domain could be easily identified, then the velocity of the longitudinal ultrasonic could be calculated by the frequency difference of two adjacent peaks; finally, based on the velocity of the longitudinal ultrasonic and the experiment data the thickness of the metal plate could be calculated by inversion algorithm. The relative errors of the thickness measurement were below 0.66% for 5052 aluminum alloy; also we found that, the measurement of thickness is more accurate as the alloy thickness decreases.

SPR phase detection for measuring the thickness of thin metal films.

Experimental Study on the Influence of the Metal Film Thickness on Surface Plasmon Resonance Biosensors

Experimental Study of the Optimal Metal Film for Surface Plasmon Resonance

Polarization interference interrogation of angular surface plasmon resonance sensors with wide metal film thickness tolerance

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Study on the property of subwavelength imaging in a metal thin-film structure

A Novel Laser Ultrasonic Thickness Measurement Method for Metal Plate Based on Spectral Analysis

Study and Numerical Simulation of a Surface Plasmon Resonance Sensor Using Bi-Beam Differential Measurement Approach

A New Method for Measuring Multilayer Thickness Using a Chromatic Confocal Sensor

Amplified Phase Measurement of Thin-Film Thickness by Swept-Source Spectral Interferometry

Simulation and Analysis of Surface Plasmon Resonance Biosensor Based on Phase Detection

Simultaneous Thickness, Velocity, Density, and Attenuation Measurement of a Thin Layer by Time-Resolved Acoustic Microscopy

Layer Analysis of Axial Spatial Distribution of Surface Plasmon Resonance Sensing.

Thickness Measurement of Magnetic Absorbing Coating on Metallic Surface by Localized Spoof Surface Plasmon-Based Sensor

Principles of Measuring Thickness and Refractive Index of Thin Dielectric Film by Using Multiresonance Archimedean Spiral Metasurfaces with C Resonator in the Terahertz Frequency Range

Optical weak measurement for the precise thickness determination of an ultra-thin film

Numerical simulations of surface plasmon resonance system for monitoring DNA hybridization and detecting protein-lipid film interactions

Spectral surface plasmon resonance sensor insensitive to the thickness of metal films

Thickness Measurement of Metallic Film Based on a High-Frequency Feature of Triple-Coil Electromagnetic Eddy Current Sensor

Research of Surface Plasmon Resonance on Gold Film Using Scanning Near-Field Optical Microscopy

Real-time phase-shift detection of the surface plasmon resonance