Diffraction and External Reflection by Dielectric Faceted Particles
Lei Bi,Ping Yang,George W. Kattawar,Yongxiang Hu,Bryan A. Baum
DOI: https://doi.org/10.1016/j.jqsrt.2010.02.007
IF: 2.342
2011-01-01
Journal of Quantitative Spectroscopy and Radiative Transfer
Abstract:The scattering of light by dielectric particles much larger than the wavelength of incident light is attributed to diffraction, external reflection and outgoing refracted waves. This paper focuses on diffraction and external reflection by faceted particles, which can be calculated semi-analytically based on physical optics. Three approximate methods; the surface-integral method (SIM), the volume-integral method (VIM), and the diffraction plus reflection pattern from ray optics (DPR) are compared. Four elements of the amplitude scattering matrix in the SIM and the VIM are presented in an explicit form. Of interest is that diffraction and external reflection are separable in the SIM, whereas they are combined in the VIM. A feature of zero forward reflection is noticed in the SIM. The applicability of the DPR method is restricted to particles with random orientations. In the manner of van de Hulst, we develop a new technique to compute the reflection pattern of randomly oriented convex particles using spheres with the same refractive index, resulting in an improvement in the precision of the reflection calculation in near-forward and near-backward directions. The accuracy of the aforementioned three methods is investigated by comparing their results with those from the discrete-dipole-approximation (DDA) method for hexagonal particles at the refractive index of 1.3+i1.0. For particles with fixed orientations, it is found that the SIM and the VIM are comparable in accuracy and applicable when the size parameter is on the order of 20. The ray-spreading effect on the phase function is evident from the results of various size parameters. For randomly oriented particles, the DPR is more efficient than the SIM and the VIM.