Pindel: A Pattern Growth Approach To Detect Break Points Of Large Deletions And Medium Sized Insertions From Paired-End Short Reads

Kai Ye,Marcel H. Schulz,Quan Long,Rolf Apweiler,Zemin Ning
DOI: https://doi.org/10.1093/bioinformatics/btp394
IF: 5.8
2009-01-01
Bioinformatics
Abstract:Motivation: There is a strong demand in the genomic community to develop effective algorithms to reliably identify genomic variants. Indel detection using next-gen data is difficult and identification of long structural variations is extremely challenging.Results: We present Pindel, a pattern growth approach, to detect breakpoints of large deletions and medium-sized insertions from paired-end short reads. We use both simulated reads and real data to demonstrate the efficiency of the computer program and accuracy of the results.
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