Shrinkage of Picosecond Laser Beam by Plasma Reflection in Super-Resolution Near-Field Structure of Sin/Sb/Sin Thin Film

Yi-Ci Li,Huei-Ling Lin,Po-Yuan Huang,Li Xin,Sidney S. Yang,Jaw-Luen Tang,Tai-Huei Wei
DOI: https://doi.org/10.1364/ol.37.002340
IF: 3.6
2012-01-01
Optics Letters
Abstract:The transmittive and reflective Z-scan technique is used with a 10 Hz, frequency doubled, Q-switched, and mode-locked Nd:YAG laser to verify that the reflectivity of the super-resolution near-field structure of an SiN/Sb/SiN thin film increases as incident intensity decreases. This intensity-dependent reflection, called nonlinear reflection, reflects a TEM(00) mode laser beam more strongly at its periphery than at its center and so shrinks the transmitted laser beam. The observed nonlinear reflection is attributed to laser-induced change of carrier densities in Sb, to justify quantitatively the experimental results.
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