X-ray Diffraction to 302 Gigapascals: High-Pressure Crystal Structure of Cesium Iodide

HK MAO,Y WU,RJ HEMLEY,LC CHEN,JF SHU,LW FINGER
DOI: https://doi.org/10.1126/science.246.4930.649
IF: 56.9
1989-01-01
Science
Abstract:X-ray diffraction measurements have been carried out on cesium iodide (CsI) to 302 gigapascals with a platinum pressure standard. The results indicate that above 200 gigapascals CsI at 300 K has a hexagonal close-packed crystal structure with the ideal c / a ratio of 1.63 ± 0.01. The crystal structure and pressure-volume relations converge at high pressure with those of solid xenon, which is isoelectronic with CsI. The results indicate a significant loss of ionic bonding in the hexagonal close-packed metallic phase of CsI at ultrahigh pressure.
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