Particle-phase Chemistry of Secondary Organic Material: Modeled Compared to Measured O:C and H:C Elemental Ratios Provide Constraints.

Qi Chen,Yingjun Liu,Neil M. Donahue,John E. Shilling,Scot T. Martin
DOI: https://doi.org/10.1021/es104398s
IF: 11.4
2011-01-01
Environmental Science & Technology
Abstract:Chemical mechanisms for the production of secondary organic material (SOM) are developed in focused laboratory studies but widely used in the complex modeling context of the atmosphere. Given this extrapolation, a stringent testing of the mechanisms is important. In addition to particle mass yield as a typical standard for model-measurement comparison, particle composition expressed as O:C and H:C elemental ratios can serve as a higher dimensional constraint. A paradigm for doing so is developed herein for SOM production from a C-5-C-10-C-15 terpene sequence, namely isoprene, a-pinene, and beta-caryopyhllene. The model MCM-SIMPOL is introduced based on the Master Chemical Mechanism (MCM v3.2) and a group contribution method for vapor pressures (SIMPOL). The O:C and H:C ratios of the SOM are measured using an Aerosol Mass Spectrometer (AMS). Detailed SOM-specific AMS calibrations for the organic contribution to the H2O+ and CO+ ions indicate that published O:C and H:C ratios for SOM are systematically too low. Overall, the measurement-model gap was small for particle mass yield but significant for particle-average elemental composition. The implication is that a key chemical pathway is missing from the chemical mechanism. The data can be explained by the particle-phase homolytic decomposition of organic hydroperoxides and subsequent alkyl-radical-promoted oligomerization.
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