Nondestructive Ion Trap Mass Analysis at High Pressure

Wei Xu,Jeffrey B. Maas,Frank J. Boudreau,William J. Chappell,Zheng Ouyang
DOI: https://doi.org/10.1021/ac1027808
IF: 7.4
2010-01-01
Analytical Chemistry
Abstract:A method for performing nondestructive ion trap mass analysis at high pressures (>1 mTorr) has been developed using image current measurement with constant dipolar excitation. Instead of monitoring the ion secular motion, a harmonic of the ion motion was used for narrow band image current measurement followed by Fourier Transform. The capability of this technique has been demonstrated with mass analysis using a single measurement at pressures of 10 mTorr or higher. Methods for mixture analysis and tandem mass spectrometry have also been developed for nondestructive mass analysis.
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