Coherent terahertz emission of intrinsic Josephson junction stacks in the hot spot regime [corrected].

H B Wang,S Guénon,B Gross,J Yuan,Z G Jiang,Y Y Zhong,M Grünzweig,A Iishi,P H Wu,T Hatano,D Koelle,R Kleiner
IF: 8.6
2010-01-01
Physical Review Letters
Abstract:We report on THz emission measurements and low temperature scanning laser imaging of Bi2Sr2CaCu2O8 intrinsic Josephson junction stacks. Coherent emission is observed at large dc input power, where a hot spot and a standing wave, formed in the "cold" part of the stack, coexist. By changing bias current and bath temperature, the emission frequency can be varied by more than 40%; the variation matches the Josephson-frequency variation with voltage. The linewidth of radiation is much smaller than expected from a purely cavity-induced synchronization. Thus, an additional mechanism seems to play a role. Some scenarios, related to the presence of the hot spot, are discussed.
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