Abstract:This paper describes the construction of an apparatus that detects the dynamic thickness/reflective-index changes of the curved thin films on the pendent droplet surfaces. The apparatus was constructed by integrating two well-established techniques: null ellipsometry and the pendent drop shape analysis system. The shape analysis system is used to precisely control the height of the objective pendent droplets. This allows the laser beam of ellipsometry to be continually locked in the exact bottom position of the pendent droplets. Such an arrangement facilitates the dynamic investigation of the film thickness as well as the continual monitoring of the surface tension. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3465314]

Dynamic Ellipsometry Study On Curved Thin Films At Pendent Droplet Surfaces