Test Effectiveness Index: Integrating Product Metrics with Process Metrics

Yan Zhang,Xuying Zhao,Xiaokun Zhang,Tian Zhang
DOI: https://doi.org/10.1109/cyber.2012.6392526
2012-01-01
Abstract:Defect measurement is an important method in the improvement of software quality. Recent approaches of defect measurement are inappropriate to small software organizations by reason of their intricacy. This paper gives a simple approach of defect measurement, which integrates the power of product metrics with process metrics, i.e., it can not only detect the defect-prone modules, but also find the problems in the software process. This approach uses the results of successive two rounds of testing to create the test effectiveness index constructively. A case study is conducted and the results indicate that the defect-prone modules can be identified and problems of testing process can be discovered by test effectiveness index.
What problem does this paper attempt to address?