Abstract:Piezoresponse Force Microscopy (PFM) is one of the most widespread methods for investigating and visualizing ferroelectric domain structures down to the nanometer length scale. PFM makes use of the direct coupling of the piezoelectric response to the crystal lattice, and hence is most often applied to spatially map the 3-dimensional (3D) near-surface domain distribution of any polar or ferroic sample. Nonetheless, since most samples investigated by PFM are at least semiconducting or fully insulating, the electric ac field emerging from the conductive scanning force microscopy (SFM) tip, penetrates the sample, and hence may also couple to polar features that are deeply buried into the bulk of the sample under investigation. Thus, in the work presented here, we experimentally and theoretically explore the contrast and depth resolution capabilities of PFM, by analyzing the dependence of several key parameters. These key parameters include the depth of the buried feature, i.e. here a domain wall (DW), as well as PFM-relevant technical parameters such as the tip radius, the PFM drive voltage and frequency, and the signal-to-noise ratio. The theoretical predictions are experimentally verified using x-cut periodically-poled lithium niobate single crystals that are specially prepared into wedge-shaped samples, in order to allow the buried feature, here the DW, to be `positioned' at any depth into the bulk. This inspection essentially contributes to the fundamental understanding in PFM contrast analysis, and to the reconstruction of 3D domain structures down to a 1-$\mu$m-penetration depth into the sample.

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High Speed Piezoresponse Force Microscopy: <1 Frame Per Second Nanoscale Imaging

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In Situ Real-Time Observation of Photoinduced Nanoscale Azo-Polymer Motions Using High-Speed Atomic Force Microscopy Combined with an Inverted Optical Microscope

Investigation of Nanoscale Ferroelectric Domains Switching by Multimode Scanning Probe Microscopy

Femtosecond single- to few-electron point-projection microscopy for nanoscale dynamic imaging

A New Heterodyne Megasonic Piezoresponse Force Microscopy with High-frequency Excitation beyond 100 MHz

In-situ real-time observation of photo-induced nanoscale azo-polymer motions using high-speed atomic force microscopy combined with an inverted optical microscope

Real-time deflection and friction force imaging by bimorph-based resonance-type high-speed scanning force microscopy in the contact mode.

Resonance-type bimorph-based high-speed atomic force microscopy: real-time imaging and distortion correction

Scanning Probe Microscopy of Ferroelectric Domains in PMN-PT Single Crystal

Demonstration of High Speed Afm Through Local Raster Scanning

Mapping Nanoscale Domain Patterns in Ferroelectric Ceramics by Atomic Force Acoustic Microscopy and Piezoresponse Force Microscopy

Depth resolution in piezoresponse force microscopy

Simultaneous dynamic characterization of charge and structural motion during ferroelectric switching

Direct Nanosecond Multiframe Imaging of Irreversible Dynamics in 4D Electron Microscopy

Force-Electric Coupling of Nanoscale Ferroelectric Domains Based on Piezoelectric Force Microscopy (PFM)