Discarding wide baseline mismatches via topological clustering

Wang, Y.T.,Zhang, D.Z.,Tian, J.-W.
DOI: https://doi.org/10.1049/el:20083624
2008-01-01
Electronics Letters
Abstract:A novel scheme called topological clustering is presented to discard SIFT mismatches, based on the topological relationship consistence between two SIFT matches. The experimental results show that the developed method can extract high correct ratio matches efficiently from low correct ratio initial matches for wide baseline image pairs.
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