Atomic Disorder Scattering in Emerging Transistors by Parameter-Free First Principle Modeling

Qing Shi,Lining Zhang,Yu Zhu,Lei Liu,Mansun Chan,Hong Guo
DOI: https://doi.org/10.1109/iedm.2014.7047144
2014-01-01
Abstract:A parameter-free first principle modeling methodology is reported with emphasis on simulating effects of atomistic disorder in nano-scale transistors. The technique is based on the developed theory of nonequilibrium coherent potential approximation and a linear scaling sparse Hamiltonian implementation. Using this technique, effects of disorder scattering to the quantum transport properties of a boron-nitrogen (B-N) co-doped graphene tunnel field effect transistor (TFET) is investigated.
What problem does this paper attempt to address?