An effective deep learning model for classifying diseases on strawberry leaves and estimating their severity based on the multi-task U‐Net
Lee, Jang Hoon,Tran, Minh Trieu
DOI: https://doi.org/10.1007/s11042-024-20413-6
IF: 2.577
2024-11-10
Multimedia Tools and Applications
Abstract:Gray mold, powdery mildew and tip burn are common diseases on strawberries, directly or indirectly affecting annual strawberry yield. Due to the serious damage caused by these diseases, the identification to control them has attracted great attention for many years. This paper presents an effective method based on multi-task U-Net to distinguish types and estimate the severity of the diseases on strawberry leaves. A dataset of 2,130 images containing gray mold, powdery mildew, tip burn, and healthy leaves was collected. The proposed model performs three tasks including disease classification, segmentation of the infected regions, and segmentation of interested leaf regions to identify diseases and their severity. We investigated the proposed model and corresponding cascade structures with the backbones of the VGGNet, ResNet, and DenseNet on our dataset. The results demonstrate that our model achieved better performance with parameters reduced by 3 to 5 times and execution times faster by 8 to 23 times compared to the cascade structures when they performed the same tasks. Moreover, the proposed model with the VGG16 backbone has the highest effectiveness. Notably, compared to U-Net and some state-of-the-art segmentation models, the identification for the early-stage diseases has been impressively improved with mDice and mIoU metrics increasing by 7-25% and 6-23%, respectively. In addition, the segmentation performance for the infected region is also higher about by 2%. The classification on a complex background dataset reached precision, recall, F1-score, and accuracy values of 99.18%, 98.90%, 99.03%, and 98.93%, respectively, higher than the performance of some existing classification models.
computer science, information systems, theory & methods,engineering, electrical & electronic, software engineering