IEEE 2014 Fourth International Workshop on Formal Methods in Services and Cloud Computing (FM-S&C 2014) Workshop Summary

Guoray Cai,Ying Li,Yuyu Yin,Honghao Gao

DOI: https://doi.org/10.1109/services.2014.24

2014-01-01

Abstract:Emerging paradigm of cloud computing provides a new service delivery platform. One of the latest challenges is how to work with service computing in a cloud computing environment. Meanwhile, the convergence of service computing and cloud computing is becoming a major driving force for the adoption of both of these technologies. It has been great advances in formal methods research via tool support and industrial best practice, and their role in a variety of industries, domains, and in certification and assurance. Also, formal methods can play a fundamental and important role in service computing and cloud computing. The topic of FM-S&C 2014 is the theory aspect of data intensive services. There is no doubt in the industry and research community that the importance of data intensive computing has been raising and will continue to be the foremost fields of research. As a result, the data intensive services have become the important type of Web service. Also, it has become a hot issue in the academia and industry. Potentially, this could have a significant impact on the on-going researches for services and data intensive computing. The scope of the FM-S&C workshop series is not limited to technological aspects. In fact, there is a strong tradition of attracting submissions on formal approaches to enterprise systems modeling in general, and business process modeling in particular. Potentially, this might have a significant and lasting impact on the ongoing standardization efforts in cloud computing technologies. All papers accepted by the workshop are included in the proceedings of the IEEE 10th World Congress on Services (SERVICES 2014) which will be published by IEEE Computer Society. Hard copies may be obtained from IEEE Computer Society according to its ordering reprints policies. The electronic copies can be obtained from IEEE Xplore Digital Library.