Fast Decay Time and Low Dark Current Mechanism in TiO 2 Ultraviolet Detector

Min Zhang,Dezhong Zhang,Fuyi Jing,Guohua Liu,Kaibo Lv,Jingran Zhou,Sheng-Ping Ruan

DOI: https://doi.org/10.1109/lpt.2014.2360581

IF: 2.6

2015-01-01

IEEE Photonics Technology Letters

Abstract:In this letter, TiO2 thin films were prepared via sol-gel method and metal/semiconductor/metal ultraviolet (UV) detectors with Pt Schottky contact were fabricated. At 5 V bias, the dark current of the device was only 80 pA. Diffusion theory was adopted to analyze the low dark current mechanism, which is consistent with the experimental results. The device shows a remarkably reduced decay time of 41.53 ms. The low dark current and improved time response performance may be attributed to the high effective Schottky barrier between Pt and TiO2 film. High responsivity of 34.5 A/W was achieved at 300 nm UV light and the ratio of photocurrent to dark current is about five orders of magnitude, which is much larger than that of other semiconductor photodetectors.