Abstract:PLS is widely used in the quality control process system, but it has poor capability in some strong local nonlinear system for fault diagnosis. To enhance the monitoring ability of such type fault, a novel statistical model based on global plus local projection to latent structures (GPLPLS) is proposed. Firstly, the characteristics and nature of quality-related global and local partial least squares (QGLPLS) are carefully analyzed, where its principal components preserve the local structure information in their respective data sheets as large as possible but not the correlation. In order to establish a quality-related model, this paper focuses more attention on the relevance of extracted principal components. Then, a quality-related monitoring strategy is established not only has the ability of PLS to extract the maximum linear relevant information but also the local nonlinear structural relevant information between the process variables and quality variables. Finally, the validity and effectiveness of GPLPLS-based statistical model are illustrated through two sets of artificial three-dimensional data of S-curve and Tennessee Eastman process (TEP) simulation platform. The experimental results demonstrate that the proposed model can be maintained the local property of the original data as much as possible and get a better monitoring result compared with PLS and QGLPLS.

Adaptive Total PLS Based Quality-Relevant Process Monitoring with Application to the Tennessee Eastman Process

Online dual updating with recursive PLS model and its application in predicting crystal size of purified terephthalic acid (PTA) process

Quality-Related Process Monitoring Based on Total Kernel PLS Model and Its Industrial Application

A Selective Moving Window Partial Least Squares Method and Its Application in Process Modeling

Quality-Relevant Process Monitoring with Concurrent Locality-Preserving Dynamic Latent Variable Method

PLS-based Optimal Quality Control Model for TE Process

Quality relevant data-driven modeling and monitoring of multivariate dynamic processes: the dynamic T-PLS approach.

Multirate Partial Least Squares for Process Monitoring

RPLS Based Adaptive Statistical Quality Monitoring of Rubber Mixing Process

Development of Decay Based PLS Model and Its Economic Run-to-Run Control for Semiconductor Processes

Probabilistic latent variable regression model for process-quality monitoring

A Quality-Related Statistical Process Monitoring Method Based on Global Plus Local Projection to Latent Structures

Total projection to latent structures for process monitoring

Supervised Linear Dynamic System Model for Quality Related Fault Detection in Dynamic Processes

Generalized Reconstruction-Based Contributions for Output-Relevant Fault Diagnosis with Application to the Tennessee Eastman Process

Quality-Relevant Data-Driven Process Monitoring Based on Orthogonal Signal Correction and Recursive Modified PLS

Process-Quality Monitoring Using Semi-Supervised Probability Latent Variable Regression Models

Output Relevant Fault Reconstruction and Fault Subspace Extraction in Total Projection to Latent Structures Models

Total PLS Based Contribution Plots for Fault Diagnosis

Output-Relevant Fault Reconstruction Based On Total Pls