Detection of Micro-Te Segregation at the Interface of Cu/Cr Phases in Cu-30Cr-0.01Te Alloy Contact Material by XPS

Jinglin Xie,Baihe Miao
DOI: https://doi.org/10.1109/icepe-st.2011.6122972
2011-01-01
Abstract:The composition and bonding energy of Te segregation in Cu-30Cr-0.01Te alloy contact material were investigated by X-ray photoelectron spectroscopy. Photoelectron patterns from the main chemical elements of Cu, Cr and Te on the fresh fracture surface of Cu-30Cr-0.01Te alloy contact material show that Te atoms highly segregated at the interface of Cu/Cr phases, thus the structure and property of the interface between Cu/Cr phases were changed and led to reduce the tensile strength and increase anti-welding property of the contact material.
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