A Simple Method Based on Vision for Obtaining Depth Information in Nanomanipulation

Changhai Ru,Bing Shao,Haibo Huang,Lining Sun
DOI: https://doi.org/10.1143/apex.4.126601
IF: 2.819
2011-01-01
Applied Physics Express
Abstract:Nanomanipulation system based on scanning electron microscopes (SEM) provides researchers with an increasing ability to interact with objects at the nanoscale. But it is difficult to accomplish a nanomanipulation task due to the lack of the depth information. This paper presents a vision-based method for detecting the contact between an end-effector and a target surface inside an SEM without adding any extra facility or sensor. The theory analysis of contact detection is given. The experimental results show that the proposed vision-based method is capable of obtaining contact points two times (approach and retract) in one contact detection process and achieving a one-pixel detection accuracy about 20 nm at 10000x magnification. (C) 2011 The Japan Society of Applied Physics
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