Measurement of Aspheric Surface
朱勇建 Zhu Yongjian,潘卫清 Pan Weiqing
DOI: https://doi.org/10.3788/LOP47.011202
2010-01-01
Laser & Optoelectronics Progress
Abstract:Aspheric technologies have been introduced widely into numerous areas such as camera,cell phone,DVD,communications,astronomy,military affairs and so on because of its high image quality,compact volume and light weight.In aspheric technologies,a key problem is to test the aspheric surface.The probe-contacting method is the earliest one and has become more and more mature,but it couldn't find a trade-off between high accuracy and high efficiency.The non-contacting methods have also been developed for almost 40 years and many different kinds of non-contacting styles are found.However,it's still difficult to realize high accuracy and efficiency at the same time by using a non-contacting technology.With the development of aspheric manufacturing,it becomes more urgent to reach the goal of high accuracy in an extremely-short time.According to different testing principles,most popular aspheric testing technologies have been discussed and compared in details and their own advantages and disadvantages have been set forth.In the end,the developing directions of aspheric surface testing have been pointed out.