Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry
Wenbo Jiang,Tong Ren,Qianhua Fu
DOI: https://doi.org/10.3390/electronics13020418
IF: 2.9
2024-01-20
Electronics
Abstract:Electronic speckle pattern interferometry (ESPI) is widely used in fields such as materials science, biomedical research, surface morphology analysis, and optical component inspection because of its high measurement accuracy, broad frequency range, and ease of measurement. Phase extraction is a critical stage in ESPI. However, conventional phase extraction methods exhibit problems such as low accuracy, slow processing speed, and poor generalization. With the continuous development of deep learning in image processing, the application of deep learning in phase extraction from electronic speckle interferometry images has become a critical topic of research. This paper reviews the principles and characteristics of ESPI and comprehensively analyzes the phase extraction processes for fringe patterns and wrapped phase maps. The application, advantages, and limitations of deep learning techniques in filtering, fringe skeleton line extraction, and phase unwrapping algorithms are discussed based on the representation of measurement results. Finally, this paper provides a perspective on future trends, such as the construction of physical models for electronic speckle interferometry, improvement and optimization of deep learning models, and quantitative evaluation of phase extraction quality, in this field.
engineering, electrical & electronic,computer science, information systems,physics, applied