Flash X-ray backlight technique using a Fresnel phase zone plate for measuring interfacial instability
Kazuki Matsuo,Takayoshi Sano,Kazuki Ishigure,Hiroki Kato,Natsuko Nagamatsu,Zhu Baojun,Guo Shuwang,Hideo Nagatomo,Nicolai Philippe,Youichi Sakawa,Yasunobu Arikawa,Shohei Sakata,SeungHo Lee,King Fai Farley Law,Hiroki Morita,Chang Liu,Huan Li,Jo Nishibata,Ryunosuke Takizawa,Hiroshi Azechi,Shinsuke Fujioka
DOI: https://doi.org/10.1016/j.hedp.2020.100837
IF: 1.19
2020-01-01
High Energy Density Physics
Abstract:Interfacial instabilities in high-energy-density plasmas are important topics in various research fields such as inertial confinement fusion, planetary sciences, and astrophysics. The growth of the instabilities can be examined in the laboratory by using high-power lasers coupled with high-resolution imaging technique. The resolutions both in space and time are essential for the observation of tiny and transient phenomena in high-energy-density plasmas. Here, the growth of a sinusoidal corrugation on the surface of a polystyrene foil during the laser-driven Richtmyer-Meshkov instability was measured by high-resolution X-ray shadowgraphy. In our experiment, a high-intensity short-pulse laser produced the X-ray flash that ensures a better temporal resolution. A Fresnel Phase Zone Plate was used for the improvement of spatial resolution, which realized an accuracy of 5.0 +/- 1.0 mu m in our system.